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DX-7A Wafer X-ray Orientation Unit
Product Detailed
Related Categories:Other Electronic Measuring Instruments
It is used to measure reference side and end side of sapphire wafer and silicon wafer.
DX-7A wafer orientation measurement unit has 2 work tables working at the same time. On one work table it can orient the end side of wafer, and on the other work table it can orient wafer’s reference side, in instrument accuracy ±30", minimum reading is 1".
DX-7A Wafer X-ray Orientation Unit
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